X-ray Fluorescence (XRF, EDXRF) Analyzer MetExpert - Z

X-ray Fluorescence (XRF, EDXRF) Analyzer MetExpert-Z was developed for a one-run non-destructive high-quality and high-sensivity analysis of test samples. X-ray Fluorescence (XRF, EDXRF) Analyzer MetExpert-Z does qualitatively and quantitatively analyse the chemical composition of solids as well as solutions. X-ray Fluorescence (XRF, EDXRF) Analyzer MetExpert-Z is able to identify more than 70 elements from Ca to Pu regarding quality and quantity in metals, alloys, geological materials, chemical compounds or in unknown samples in one run.
X-ray Fluorescence (XRF, EDXRF) Analyzer MetExpert - Z is used for non-destructive analysis of main and secondary elements in practically all materials. This applies to analysis in: incoming and stock alloys inspection, metal scrap upgrade and classification, precious metal non-destructive identification and analysis, alloys verification archaeological & art objects analysis, non-destructive element analysis of geological material as well as in scientific research, precise identification of alloys, quality monitoring in metal industry, material identification and control.
The MS Windows based unique software of X-ray Fluorescence (XRF, EDXRF) Analyzers MetExpert-Z automatically controls all functions of the spectrometer. Many thousands of measurements, including spectra, can be saved to hard disk and printed-out later or moved to another PC for further processing.

X-ray Fluorescence (XRF, EDXRF) Analyzer MetExpert - Z is applicable in all areas of research, development, education & production.

More information about X-ray Fluorescence (XRF, EDXRF) Analyzer MetExpert - Z You can find on the MetExperts Homepage:

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